Various semiconductor companies and manufacturing vendors make tremendous efforts to push advanced memory technologies (e.g., FinFET at below 10nm) and emerging memory technologies (such as STT-MRAM, RRAM, and PCM) to the market/ commercialization. Testing is the last chance to check and guarantee the required quality and reliability of the outgoing manufactured memory devices.
CognitiveIC has demonstrated, in collaboration with its partners and based on memory test chips, that the semiconductor industry cannot rely on existing solutions to achieve high quality product quality. Our solutions are based on Device-Aware-TestTM that closes the gap between the real defect mechanism and the way they are traditionally modeled at the electrical level. Hence, resulting in efficient and optimal test solutions that does not only reduce the escapes, but also enable fast diagnosis and fast yield learning.